Ключевые слова: HTS, YBCO, coated conductors, thin films, stripes, LTS, Nb, patterning, substrates, wires multifilamentary, filaments, substrate SrTiO3, microstructure
Ключевые слова: MgB2, wires multifilamentary, filaments, X-ray tomography, experimental results
Inoue M., Hasegawa M., Sakamoto K., Baba T., Luongo C., Shimizu T., Saito K., Kuno K., Nakahira M., Yamane M., Nakamoto M., Fujiwara E., Kasai Y., Shimane H., N.Koizumi, Shichijo T.
Ключевые слова: Nb3Sn, magnets, test results, ITER, coils toroidal, Japan, fabrication, LTS
Higashikawa K., Kiss T., Izumi T., Inoue M., Kato T., Kumakura H., Matsumoto A., Machi T., Yoshida R., Ibi A., Ye S.
Awaji S., Teranishi R., Inoue M., Sato Y., Matsumoto A., Kaneko K., Hiramatsu K., Miyajima T., Yasuyama S.
Ключевые слова: HTS, GdBCO, coated conductors, joints superconducting , fabrication, buffer layers, GdBCO, resistance, X-ray diffraction, microstructure, pressure dependence, experimental results
Ключевые слова: HTS, YGdBCO, coated conductors, multistage process, TFA-MOD process, fabrication, doping effect, critical caracteristics, critical current density, current-voltage characteristics, pinning, comparison, EuBCO, PLD process, Jc/B curves, temperature dependence, angular dependence, experimental results
Ключевые слова: power equipment, FCL resistive, HTS, REBCO, coated conductors, modeling, transient performance, fault currents, current limiting characteristics, percolation model, cooling technology, local distribution, voltage, current, homogeneity, resistance, time evolution, railway applications, loop
Ключевые слова: MgB2/Fe, wires, measurement technique, X-ray tomography
Ключевые слова: power equipment, railway applications, modeling, numerical analysis, HTS, Bi2223, tapes, cables, dc performance, coated conductors, REBCO, FCL, fault currents, loop
Higashikawa K., Kiss T., Izumi T., Inoue M., Imamura K., Kitaguchi H., Ibi A., Suzuki T., Uetsuhara D., Onodera Y., Lyu L., TAKASAKI K.
Ключевые слова: HTS, Bi2223, tapes multifilamentary, REBCO, GdBCO, coated conductors, transport currents, thermal stability, comparison, heat loads, overcurrent, critical caracteristics, current-voltage characteristics, flux flow, dissipative properties, numerical analysis, modeling, current sharing, thermal runaway, local distribution, critical current, homogeneity
Nakamura T., Higashikawa K., Kiss T., Izumi T., Shiohara Y., Hasegawa T., Inoue M., Takahashi Y., Koizumi T., Yoshizumi M., Kimura K., Hironaga R.
Hayashi K., Higashikawa K., Kiss T., Tomita M., Inoue M., Furukawa K., Kikuchi M., Kobayashi S.-I., SATO K.-I., Nakashima T., Imado K.
Higashikawa K., Awaji S., Watanabe K., Kiss T., Izumi T., Inoue M., Imamura K., Tanaka K., Taneda T., Yoshizumi M.
Ключевые слова: HTS, GdBCO, coated conductors, IBAD process, critical caracteristics, doping effect, Jc/B curves, pinning force, experimental results
Higashikawa K., Kiss T., Izumi T., Shiohara Y., Inoue M., Ohmatsu K., Konishi M., Machi T., Yoshizumi M., Shingai Y., Katahira K.
Nakamura T., Higashikawa K., Kiss T., Izumi T., Shiohara Y., Hasegawa T., Inoue M., Takahashi Y., Kato T., Koizumi T., Yoshizumi M., Kimura K., Nakanishi T., Hironaga R.
Higashikawa K., Izumi T., Inoue M., Ohmatsu K., Konishi M., Okumura K., Yoshizumi M., Shiohara K., Katahira K.
Higashikawa K., Kiss T., Izumi T., Shiohara Y., Inoue M., Kato T., Hirayama T., Yoshizumi M., Tobita H., Notoh K.
Higashikawa K., Lee S., Kiss T., Izumi T., Inoue M., Okamoto H., Chikumoto N., Machi T., Tanabe K., Shiohara K.
Ключевые слова: HTS, YBCO, coated conductors, fabrication, TFA-MOD process, critical caracteristics, critical current density, distribution, homogeneity
Iijima Y., Higashikawa K., Kiss T., Saitoh T., Izumi T., Inoue M., Imamura K., Okamoto H., Okumura K., Machi T., Yoshizumi M., Shiohara K., Komaki Y.
Iijima Y., Higashikawa K., Awaji S., Watanabe K., Kiss T., Saitoh T., Izumi T., Inoue M., Fuger R., Namba M.
Kiss T., Teranishi R., Izumi T., Inoue M., Mukaida M., Yoshizumi M., Yamada K., Mori N., Kaneko K., Maebatake T., Ichinose Y., Munetoh S.
Ключевые слова: HTS, coated conductors, joints, diffusion process, YBCO, joint resistances, pressure dependence, REBCO, experimental results
Iijima Y., Higashikawa K., Kiss T., Saitoh T., Izumi T., Inoue M., Imamura K., Kakimoto K., Shiohara K., Kawaguchi T.
Higashikawa K., Awaji S., Watanabe K., Kiss T., Inoue M., Yamada Y., Ibi A., Fukushima H., Fuger R., Namba M., Izumi
Ayai N., Hayashi K., Higashikawa K., Kiss T., Inoue M., Sato K., Kitaguchi H., Kumakura H., Kobayashi S., Yamazaki K., Fujikami J., Kikuchi M., Shimoyama J., Nakashima T., YAMADE S., Tatamidani K., Osabe G., Kagiyama T., Shizuya E.
Higashikawa K., Awaji S., Watanabe K., Kiss T., Izumi T., Inoue M., Yamada Y., Ibi A., Fukushima H., Fuger R., Namba M.
Awaji S., Watanabe K., Kiss T., Teranishi R., Izumi T., Inoue M., Mukaida M., Miura M., Yoshizumi M., Yamada K., Mori N., Namba M., Miyanaga Y.
Ключевые слова: HTS, coated conductors, measurement technique, ac losses, YBCO, Hall sensor, magnetic field distribution
Ключевые слова: HTS, Bi2223, fabrication, overpressure processing, tapes, Hall sensor, magnetic field distribution, experimental results
Higashikawa K., Kiss T., Izumi T., Inoue M., Iwakuma M., Yamada Y., Nakao K., Chikumoto N., Honda Y.
Ключевые слова: presentation, HTS, YBCO, coated conductors, ac losses, distribution, local distribution, measurement setup, measurement technique, current distribution, coated conductors multifilamentary, transport currents, critical caracteristics, current-voltage characteristics, experimental results
Kiss T., Teranishi R., Izumi T., Shiohara Y., Inoue M., Matsuda J., Mukaida M., Nakaoka K., Yamada K., Mori N., Yoshida J.
Ключевые слова: HTS, YBCO, films, TFA-MOD process, substrate LaAlO3, fabrication, microstructure
Kiss T., Teranishi R., Izumi T., Shiohara Y., Inoue M., Mukaida M., Miura M., Nakaoka K., Yoshizumi M., Yamada K., Mori N., Tada K., Yoshida J.
Ключевые слова: HTS, YBCO, films, substrate LaAlO3, TFA-MOD process, precursors, composition, critical caracteristics, critical current density, microstructure, fabrication
Awaji S., Watanabe K., Kiss T., Teranishi R., Izumi T., Shiohara Y., Inoue M., Mukaida M., Nakaoka K., Yoshizumi M., Yamada K., Mori N., Miyanaga Y., Nanba M.
Awaji S., Watanabe K., Kiss T., Izumi T., Shiohara Y., Inoue M., Yamada Y., Yoshizumi M., Motoyama K.
Ключевые слова: HTS, coated conductors, YBCO, Hall sensor, magnetic field distribution, current distribution, current density, experimental results
Kiss T., Teranishi R., Izumi T., Shiohara Y., Inoue M., Matsuda J., Mukaida M., Nakaoka K., Yamada K., Mori N., Mitani A., Hisatsune Y.
Ключевые слова: HTS, REBCO, films, TFA-MOD process, substrate LaAlO3, grain alignment, fabrication
Kiss T., Nagaya S., Kashima N., Shiohara Y., Watanabe T., Inoue M., Yamada Y., Miyata S., Ibi A., Mori M., Enpuku K., Zulkifli Z.
Ключевые слова: HTS, YBCO, coated conductors, IBAD process, CVD process, microstructure, homogeneity, current density, dissipative properties, flux flow, experimental results, fabrication
Kiss T., Teranishi R., Izumi T., Shiohara Y., Inoue M., Matsuda J., Mukaida M., Nakaoka K., Yamada K., Mori N., Mitani A.
Ключевые слова: HTS, REBCO, films, TFA-MOD process, substrate LaAlO3, microstructure, fabrication
Kiss T., Teranishi R., Izumi T., Shiohara Y., Inoue M., Tanaka T., Matsuda J., Mukaida M., Nakaoka K., Yamada K., Mori N., Tada K., Yoshida J.
Ключевые слова: HTS, YBCO, films, substrate LaAlO3, TFA-MOD process, microstructure, fabrication
Kiss T., Teranishi R., Izumi T., Shiohara Y., Inoue M., Matsuda J., Mukaida M., Nakaoka K., Yamada K., Mori N., Tada K., Yoshida J.
Ключевые слова: HTS, YBCO, films, substrate LaAlO3, TFA-MOD process, fabrication, critical current density, composition, microstructure, critical caracteristics
Higashikawa K., Kiss T., Izumi T., Shiohara Y., Inoue M., Imamura K., Yamada Y., Miyata S., Nakao K., Chikumoto N., Ibi A., Yoshizumi M., Kato J., Matsekh A., Abiru K., Honda Y.
Ключевые слова: HTS, YBCO, coated conductors, ac losses, critical caracteristics, numerical analysis
Nakamura T., Awaji S., Watanabe K., Kiss T., Shiohara Y., Inoue M., Yamada Y., Miyata S., Fujiwara T., Ibi A., Mitsui D.
Nakamura T., Kiss T., Shiohara Y., Inoue M., Imamura K., Kato T., Yamada Y., Hirayama T., Ibi A., Shoyama T., Koyanagi S., Mitsui D.
Nakamura T., Takahashi K., Awaji S., Watanabe K., Kiss T., Shiohara Y., Inoue M., Yamada Y., Miyata S., Fujiwara T., Ibi A., Mitsui D., Motoyama K.
Nakamura T., Takahashi K., Awaji S., Watanabe K., Kiss T., Inoue M., Yamada Y., Ibi A., Shiohara Y.Y., Mitsui D., Fujiwara T.N.
Nakamura T., Takeo M., Kiss T.(kiss@sc.kyushu-u.ac.jp), Inoue M., Imamura K., Koyanagi K., Shiohara Y.(shiohara@istec.or.jp)
Ключевые слова: HTS, YBCO, films epitaxial, substrate SrTiO3, defects, local distribution, current density, current distribution, measurement technique
Iijima Y., Awaji S., Watanabe K., Takeo M., Kiss T., Saitoh T., Tokunaga Y., Izumi T., Shiohara Y., Inoue M., Kakimoto K., Matsuda J., Sawa H., Tsuda Y.
Iijima Y., Takeo M., Kiss T., Saitoh T., Tokunaga Y., Imamura K., Kakimoto K., Inoue M.(inoue@ees.kyushu-u.ac.jp), Matsuda J., Koyanagi S.
Ключевые слова: HTS, YBCO, coated conductors, trapped field, measurement technique, experimental results, magnetic properties
Iijima Y., Takeo M., Kiss T., Saitoh T., Tokunaga Y., Imamura K., Kakimoto K., Inoue M.(inoue@ees.kyushu-u.ac.jp), Tokutomi H., Shoyama T.
Iijima Y., Kiss T., Saitoh T., Inoue M., Matsushita T., Kakimoto K., Otabe E.S., Kiuchi M., Fukumoto Y.(fukumoto@aquarius10.cse.kyutech.ac.jp), Sawa H.
Iijima Y., Kiss T., Saitoh T., Inoue M., Kuga T., Matsushita T., Kakimoto K., Otabe E.S., Yamauchi K.(yamauchi@aquarius10.cse.kyutech.ac.jp), Kiuchi M.
Iijima Y., Awaji S., Watanabe K., Takeo M., Kiss T., Saitoh T., Shiohara Y., Kuga T., Ishimaru M., Matsushita T., Kakimoto K., Inoue M.(inoue@ees.kyushu-u.ac.jp)
Iijima Y., Awaji S., Watanabe K., Takeo M., Saitoh T., Shiohara Y., Kiss T.(kiss@sc.kyushu-u.ac.jp), Inoue M., Kuga T., Ishimaru M., Egashira S., Irie S., Ohta T., Imamura K., Yasunaga M., Matsushita T., Kakimoto K.
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